Method for measuring a three-dimensional object, or assembly...

Details Method for measuring a three-dimensional object, or assembly... Method for measuring a three-dimensional object, or assembly...

2006-08-15

2006-08-15

Bella, Matthew C. (Department: 2624)

Image analysis

Applications

3-d or stereo imaging analysis

C382S199000, C382S203000, C382S206000, C345S419000

Reexamination Certificate

active

07092562

ABSTRACT:
In this system, three-dimensional objects (1, 5, 6) in an environment that may be very complex are discerned by identifying their simple contour shapes on images, and the geometric characteristics of these objects and their positions and orientations are then measured. Contours are defined by simple length, inclination, position parameters, etc. The acquired knowledge of the environment is used in each new image to refine the estimates, while introducing new object contours that have appeared, into the model.

REFERENCES:
patent: 5528194 (1996-06-01), Ohtani et al.
patent: 5537494 (1996-07-01), Toh
patent: 6249285 (2001-06-01), Madden et al.
patent: 43 25 269 (1995-02-01), None
patent: 2 272 515 (1994-05-01), None

Affiliated with

Also associated with

Rating

Method for measuring a three-dimensional object, or assembly... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for measuring a three-dimensional object, or assembly..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for measuring a three-dimensional object, or assembly... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3610560