Method for measuring a characteristic of semiconductor memory de

Details Method for measuring a characteristic of semiconductor memory de Method for measuring a characteristic of semiconductor memory de

1986-12-11

1989-04-11

Karlsen, Ernest F.

Electricity: measuring and testing

Plural, automatically sequential tests

324158R, 371 21, G01R 3128, G01R 3126

Patent

active

048209740

ABSTRACT:
Method for measuring power supply current, e.g., standby current of a random access memory in which, before starting measurement of the power supply current, data is read-out from memory cell of the random access memory and opposite data is written in the memory cell so that the random access memory enters into an unstabilized state. By use of this method, the measurement of the maximum power supply current can be conducted precisely.

REFERENCES:
patent: 3576982 (1971-05-01), Duke
patent: 4045779 (1977-08-01), Markle
patent: 4271519 (1981-06-01), Hall
patent: 4553225 (1985-11-01), Ohe
patent: 4637020 (1987-01-01), Schinabeck
patent: 4686456 (1987-08-01), Furuyama et al.

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