Electricity: measuring and testing – Magnetic – With means to create magnetic field to test material
Reexamination Certificate
2007-01-09
2007-01-09
Patidar, Jay M. (Department: 2862)
Electricity: measuring and testing
Magnetic
With means to create magnetic field to test material
C324S209000, C324S240000
Reexamination Certificate
active
10633905
ABSTRACT:
Material condition monitoring may be performed by electromagnetic sensors and sensor arrays mounted to the material surface. The sensors typically have a periodic winding or electrode structure that creates a periodic sensing field when driven by an electrical signal. The sensors can be thin and flexible so that they conform to the surface of the test material. They can also be mounted such that they do not significantly modify the environmental exposure conditions for the test material, such as by creating stand-off gaps between the sensor and material surface or by perforating the sensor substrate.
REFERENCES:
patent: 4164874 (1979-08-01), Cassatt et al.
patent: 4271393 (1981-06-01), Hansen et al.
patent: 4384252 (1983-05-01), Kolter
patent: 4644271 (1987-02-01), Toth et al.
patent: 4746858 (1988-05-01), Metala et al.
patent: 4810966 (1989-03-01), Schmall
patent: 4963826 (1990-10-01), Capobianco et al.
patent: 5006800 (1991-04-01), Hedengren et al.
patent: 5015951 (1991-05-01), Melcher
patent: 5227731 (1993-07-01), Prabhakaran et al.
patent: 5262722 (1993-11-01), Hedengren et al.
patent: 5311128 (1994-05-01), Lareau et al.
patent: 5453689 (1995-09-01), Goldfine et al.
patent: 5549803 (1996-08-01), Schoess et al.
patent: 5610517 (1997-03-01), Ma et al.
patent: 5617024 (1997-04-01), Simpson et al.
patent: 5629621 (1997-05-01), Goldfine et al.
patent: 5698977 (1997-12-01), Simpson et al.
patent: 5793206 (1998-08-01), Goldfine et al.
patent: 5966011 (1999-10-01), Goldfine et al.
patent: 5969260 (1999-10-01), Belk et al.
patent: 6420867 (2002-07-01), Goldfine et al.
patent: 6501267 (2002-12-01), Kurokawa et al.
patent: 6657429 (2003-12-01), Goldfine et al.
patent: 0 577 244 (1994-01-01), None
patent: 0 884 588 (1998-12-01), None
patent: 886247 (1962-01-01), None
patent: 1 567 600 (1980-05-01), None
patent: WO 98/30921 (1998-07-01), None
patent: WO 98/40732 (1998-09-01), None
patent: WO 99/22231 (1999-05-01), None
patent: WO 99/26062 (1999-05-01), None
Chepolis William M.
Clark David C.
Goldfine Neil J.
Schlicker Darrell E.
Tsukernik Vladimir
Hamilton Brook Smith & Reynolds P.C.
Jentek Sensors, Inc.
Patidar Jay M.
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