Method for marking defect and device therefor

Details Method for marking defect and device therefor Method for marking defect and device therefor

2008-08-13

2009-10-06

Lauchman, L. G (Department: 2877)

Optics: measuring and testing

Inspection of flaws or impurities

Surface condition

C356S430000, C401S136000, C401S099000

Reexamination Certificate

active

07599052

ABSTRACT:
A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.

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