Method for mapping surfaces adapted for receiving electrical com

Measuring and testing – Surface and cutting edge testing – Roughness

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G01B 728

Patent

active

056914679

ABSTRACT:
A method for mapping a surface adapted for receiving electrical components comprising the steps or providing a probe having a plurality of contacts, moving the probe toward the surface at a predetermined rate of speed, recording the time of all occurrences of contact between each of the probe contacts and the surface, determining the height of each portion of the surface contacted by one of the probe contacts, and correcting the height to account for non-planarity of the probe contacts.

REFERENCES:
patent: 4027935 (1977-06-01), Byrnes et al.
patent: 4414747 (1983-11-01), Fale, Jr. et al.
patent: 4918374 (1990-04-01), Stewart et al.

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