Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate
2005-09-02
2009-10-13
Pham, Thanh V (Department: 2894)
Semiconductor device manufacturing: process
Chemical etching
Combined with the removal of material by nonchemical means
Reexamination Certificate
active
07601644
ABSTRACT:
This silicon wafer production process comprises in the order indicated a planarization step, in which the front surface and the rear surface of a wafer are ground or lapped, a single-wafer acid etching step, in which an acid etching liquid is supplied to the surface of the wafer while spinning and the entire wafer surface is etched to control the surface roughness Ra to 0.20 μm or less, and a double-sided simultaneous polishing step, in which the front surface and the rear surface of the acid etched wafer are polished simultaneously. The process may comprise a single-sided polishing step, in which the top and bottom of the acid etched wafer are polished in turn, instead of the double-sided simultaneously polishing step.
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Supplementary European Search Report for Application No. EP 05 78 1387 dated Aug. 12, 2008.
Hashii Tomohiro
Katoh Takeo
Koyata Sakae
Murayama Katsuhiko
Takaishi Kazushige
Henry Caleb
Pham Thanh V
Pillsbury Winthrop Shaw & Pittman LLP
Sumco Corporation
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