Semiconductor device manufacturing: process – Including control responsive to sensed condition – Electrical characteristic sensed
Reexamination Certificate
2008-06-05
2010-06-29
Lee, Calvin (Department: 2892)
Semiconductor device manufacturing: process
Including control responsive to sensed condition
Electrical characteristic sensed
C257S048000, C514S033000, C514S038000
Reexamination Certificate
active
07745235
ABSTRACT:
A semiconductor sensor is disclosed that includes a substrate including at least a semiconductor layer. The substrate includes a weight arranging part in the vicinity of the center of the substrate, a flexible part around the weight arranging part, and supporting parts provided around the flexible part. The semiconductor sensor further includes a weight arranged on the weight arranging part. The weight is made of a material different from that of the weight arranging part and the flexible parts.
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Mar. 28, 2006 official action in corresponding Japanese patent application.
Cooper & Dunham LLP
Lee Calvin
Ricoh & Company, Ltd.
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