Semiconductor device manufacturing: process – Making conductivity modulation device
Reexamination Certificate
2008-03-21
2009-06-16
Nhu, David (Department: 2895)
Semiconductor device manufacturing: process
Making conductivity modulation device
C438S030000, C438S091000, C257SE21320, C257SE21126, C257SE21352, C257SE21365
Reexamination Certificate
active
07547587
ABSTRACT:
A laminated structure having light-emitting units is formed on a single-crystal wafer. Electrode patterns are formed on the single-crystal wafer opposite the light-emitting units. Dummy patterns are formed on the single-crystal wafer at a location spaced apart from a location opposite the light-emitting units, and offset from a desired cleavage line intersecting the light-emitting units. A scratch is formed on the desired cleavage line. The wafer is cleaved, originating on the scratch, along the cleavage line orientation, in the direction from the dummy pattern, toward the light-emitting units.
REFERENCES:
patent: 6774968 (2004-08-01), Hagiwara
patent: 7088416 (2006-08-01), Hagiwara
patent: 2002/0080319 (2002-06-01), Hagiwara
patent: 2004/0239858 (2004-12-01), Hagiwara
patent: 7-86687 (1995-03-01), None
patent: 10-144989 (1998-05-01), None
Abe Hajime
Ishio Noriaki
Nakamura Hitoshi
Leydig , Voit & Mayer, Ltd.
Mitsubishi Electric Corporation
Nhu David
LandOfFree
Method for manufacturing semiconductor light emitting device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for manufacturing semiconductor light emitting device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for manufacturing semiconductor light emitting device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4059525