Method for manufacturing semiconductor device including...

Details Method for manufacturing semiconductor device including... Method for manufacturing semiconductor device including...

2011-03-15

2011-03-15

Kebede, Brook (Department: 2894)

Semiconductor device manufacturing: process

With measuring or testing

C257SE21529

Reexamination Certificate

active

07906349

ABSTRACT:
A method for manufacturing a semiconductor device includes the step of conducting an acceptance/rejection judgment about the semiconductor device. The acceptance/rejection judgment is conducted by using a hysteresis loop that indicates the relationship between the applied voltage and the polarization quantity of the ferroelectric capacitor.

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patent: 6008659 (1999-12-01), Traynor
patent: 7203108 (2007-04-01), Noma
patent: 11-102600 (1999-04-01), None
patent: 2002-025295 (2002-01-01), None
patent: 2006-139866 (2006-06-01), None

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