Semiconductor device manufacturing: process – Having magnetic or ferroelectric component
Reexamination Certificate
2006-06-12
2009-12-08
Thai, Luan C (Department: 2891)
Semiconductor device manufacturing: process
Having magnetic or ferroelectric component
C438S681000, C438S239000, C438S254000, C257S295000, C257SE21664, C257SE21663, C257SE21648
Reexamination Certificate
active
07629183
ABSTRACT:
A method for fabricating a semiconductor device includes the steps of forming a PbTiOx film having a predominantly (111) orientation on a lower electrode as a nucleation layer by an MOCVD process with a film thickness exceeding 2 nm, and forming a PZT film having a predominantly (111) orientation on the nucleation layer, wherein the step of forming the PbTiOx film is conducted under an oxygen partial pressure of less than 340 Pa.
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Matsumoto Kenji
Nasu Masayuki
Sakoda Tomoyuki
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
Thai Luan C
Tokyo Electron Limited
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