Method for manufacturing semiconductor device and capacitor

Semiconductor device manufacturing: process – Making passive device – Stacked capacitor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S653000, C438S654000, C438S685000, C438S686000

Reexamination Certificate

active

06902983

ABSTRACT:
A semiconductor devices includes: a diffusion barrier layer composed of ternary compound elements formed on a substrate, wherein the diffusion barrier contains ruthenium, titanium and oxygen; and a capacitor formed on the diffusion barrier layer, wherein the capacitor includes a bottom electrode formed on the diffusion barrier layer, a dielectric layer formed on the bottom electrode and a top electrode formed on the dielectric layer.

REFERENCES:
patent: 6011284 (2000-01-01), Katori et al.
patent: 6015989 (2000-01-01), Horikawa et al.
patent: 6133159 (2000-10-01), Vaartstra et al.
patent: 6207232 (2001-03-01), Kadokura
patent: 2002/0001971 (2002-01-01), Cho
patent: 10-022469 (1998-01-01), None
patent: 10-242409 (1998-09-01), None

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for manufacturing semiconductor device and capacitor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for manufacturing semiconductor device and capacitor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for manufacturing semiconductor device and capacitor will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3515129

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.