Semiconductor device manufacturing: process – Making passive device – Stacked capacitor
Reexamination Certificate
2005-06-07
2005-06-07
Wilczewski, M. (Department: 2822)
Semiconductor device manufacturing: process
Making passive device
Stacked capacitor
C438S653000, C438S654000, C438S685000, C438S686000
Reexamination Certificate
active
06902983
ABSTRACT:
A semiconductor devices includes: a diffusion barrier layer composed of ternary compound elements formed on a substrate, wherein the diffusion barrier contains ruthenium, titanium and oxygen; and a capacitor formed on the diffusion barrier layer, wherein the capacitor includes a bottom electrode formed on the diffusion barrier layer, a dielectric layer formed on the bottom electrode and a top electrode formed on the dielectric layer.
REFERENCES:
patent: 6011284 (2000-01-01), Katori et al.
patent: 6015989 (2000-01-01), Horikawa et al.
patent: 6133159 (2000-10-01), Vaartstra et al.
patent: 6207232 (2001-03-01), Kadokura
patent: 2002/0001971 (2002-01-01), Cho
patent: 10-022469 (1998-01-01), None
patent: 10-242409 (1998-09-01), None
No associations
LandOfFree
Method for manufacturing semiconductor device and capacitor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for manufacturing semiconductor device and capacitor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for manufacturing semiconductor device and capacitor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3515129