Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate
2010-06-30
2011-10-25
Lebentritt, Michael (Department: 2829)
Semiconductor device manufacturing: process
Chemical etching
Combined with the removal of material by nonchemical means
C438S759000, C257SE21596
Reexamination Certificate
active
08043969
ABSTRACT:
A first layer is formed over a substrate, a light absorbing layer is formed over the first layer, and a layer having a light-transmitting property is formed over the light absorbing layer. The light absorbing layer is selectively irradiated with a laser beam via the layer having a light-transmitting property. When the light absorbing layer absorbs energy of the laser beam, due to emission of gas that is within the light absorbing layer, or sublimation, evaporation, or the like of the light absorbing layer, a part of the light absorbing layer and a part of the layer having a light-transmitting property in contact with the light absorbing layer are removed. By using the remaining part of the layer having a light-transmitting property or the remaining part of the light absorbing layer as a mask and etching the first layer, the first layer can be processed into a desired shape.
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Office Action re Chinese application No. CN 200710146856.X, dated Apr. 27, 2010 (with English translation).
Miyairi Hidekazu
Shoji Hironobu
Tanaka Koichiro
Yamazaki Shunpei
Husch & Blackwell LLP
Lebentritt Michael
Semiconductor Energy Laboratory Co,. Ltd.
Whalen Daniel
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