Method for manufacturing semiconductor device

Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Responsive to electromagnetic radiation

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S164000, C257SE21086

Reexamination Certificate

active

07855096

ABSTRACT:
A semiconductor film is formed on a GaAs substrate (semiconductor substrate). An SiO2film (insulating film) is formed on the semiconductor film, and the SiO2film is patterned. The semiconductor film is etched using the SiO2film as a mask to form a mesa structure. The surface of the SiO2film is treated by ashing, using SF6gas (fluorine-containing gas), to terminate the surface of the SiO2film with fluorine. The mesa structure is selectively buried with a III-V compound semiconductor film, using the SiO2film having the surface that has been terminated by fluorine, as a mask.

REFERENCES:
patent: 5400740 (1995-03-01), Goto et al.
patent: 5622559 (1997-04-01), Goto et al.
patent: 5770471 (1998-06-01), Nagai
patent: 5864161 (1999-01-01), Mitani et al.
patent: 6342421 (2002-01-01), Mitani et al.
patent: 2006/0105505 (2006-05-01), Behammer
patent: 5-175150 (1993-07-01), None
patent: 5-226362 (1993-09-01), None
patent: 5-335241 (1993-12-01), None
patent: 8-78335 (1996-03-01), None
patent: 8-107144 (1996-04-01), None
patent: 8-153688 (1996-06-01), None
patent: 9-82798 (1997-03-01), None
patent: 9-92621 (1997-04-01), None
patent: 9-320964 (1997-12-01), None
patent: 11-274645 (1999-10-01), None
patent: 2006-135340 (2006-05-01), None
Tsuji, M. et al.; “Selective growth of InAlAs by low pressure metalorganic vapor phase epitaxy”,J. of Crystal Growth, 162, pp. 25-30, (1996).
Shimoyama, K. et al.; “Novel selective area growth of AIGaAs and AlAs with HCI gas by MOVPE”,J. of Crystal Growth, 124, pp. 235-242, (1992).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for manufacturing semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for manufacturing semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for manufacturing semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4231313

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.