Method for manufacturing semiconductor device

Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S706000, C438S707000, C438S710000, C438S712000

Reexamination Certificate

active

07829470

ABSTRACT:
A contact hole, after hole etching, is subjected to light etching using a process gas containing a fluorocarbon-based gas and oxygen, with the oxygen being enriched, under condition without applying bias. Then, reaction products (5) having C—F bond and adhered to an interior of a hole (3) are removed using plasma treatment. After that, deposits (4) that have been left at a hole bottom are removed by wet processing. Then, a conductive material is buried in the hole to form a contact plug (7).

REFERENCES:
patent: 6057247 (2000-05-01), Imai et al.
patent: 6235640 (2001-05-01), Ebel et al.
patent: 6376384 (2002-04-01), Yen et al.
patent: 2006/0079095 (2006-04-01), McReynolds et al.
patent: 2006/0089003 (2006-04-01), Cheng et al.
patent: 2008/0153307 (2008-06-01), Yamada et al.
patent: 9-162172 (1997-06-01), None
patent: 11-145111 (1999-05-01), None
patent: 11-345874 (1999-12-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for manufacturing semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for manufacturing semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for manufacturing semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4186213

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.