Method for manufacturing semiconductor device

Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S629000, C438S642000, C438S720000

Reexamination Certificate

active

11321628

ABSTRACT:
Disclosed herein is a method for manufacturing a semiconductor device. According to the present invention, a bit line contact region and a storage node contact region are simultaneously formed, and then a storage node contact hole is formed after a form of bit line to reduce a height of a finally formed storage node contact plug, thereby increasing a storage node open area and reducing a short circuit between the bit lines.

REFERENCES:
patent: 6074918 (2000-06-01), Lee
patent: 6569729 (2003-05-01), Wu et al.
patent: 6812572 (2004-11-01), Yang et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for manufacturing semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for manufacturing semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for manufacturing semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3838150

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.