Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2007-10-02
2007-10-02
Vinh, Lan (Department: 1765)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C438S629000, C438S642000, C438S720000
Reexamination Certificate
active
11321628
ABSTRACT:
Disclosed herein is a method for manufacturing a semiconductor device. According to the present invention, a bit line contact region and a storage node contact region are simultaneously formed, and then a storage node contact hole is formed after a form of bit line to reduce a height of a finally formed storage node contact plug, thereby increasing a storage node open area and reducing a short circuit between the bit lines.
REFERENCES:
patent: 6074918 (2000-06-01), Lee
patent: 6569729 (2003-05-01), Wu et al.
patent: 6812572 (2004-11-01), Yang et al.
Hynix / Semiconductor Inc.
Townsend & Townsend & Crew LLP
Vinh Lan
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