Method for manufacturing semiconductor device

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Substrate dicing

Reexamination Certificate

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Details

C438S042000, C438S460000, C438S462000, C257SE21001

Reexamination Certificate

active

11188601

ABSTRACT:
The inventive method for manufacturing a semiconductor device is a method for manufacturing a semiconductor device using irradiation with laser light to partition a substrate having semiconductor layers formed thereon, with gallium contained in at least one of the substrate and the semiconductor layers, wherein the method comprises: forming grooves to be used as boundaries between individual substrates by irradiating the substrate along partitioning locations with laser light, immersing the substrate into an acid solution, and partitioning the substrate into individual substrates along the boundaries where grooves are formed. In this manner, it provides a method for manufacturing a semiconductor device in which, during the partitioning of a gallium-containing semiconductor device substrate, deposits of gallium compounds adhered during laser irradiation are removed, partitioning surfaces are formed flat and uniform, and the incidence of electrode continuity failures and resin peeling is low.

REFERENCES:
patent: 6261856 (2001-07-01), Shinohara et al.
patent: 6677173 (2004-01-01), Ota
patent: 6794272 (2004-09-01), Turner et al.
patent: 6956241 (2005-10-01), Sugawara et al.
patent: 2006/0153262 (2006-07-01), Barbieri et al.
patent: 2006/0231852 (2006-10-01), Kususe et al.
patent: 11-163403 (1999-06-01), None
patent: 11-177137 (1999-07-01), None
patent: 2001-284292 (2001-10-01), None

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