Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2006-10-03
2006-10-03
Vinh, Lan (Department: 1765)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C438S253000, C438S706000, C134S001100
Reexamination Certificate
active
07115522
ABSTRACT:
A method for manufacturing a semiconductor device including a substrate to be processed having a conductive layer essentially consisting of platinum includes etching the conductive layer, and generating plasma and cleaning the substrate, to which an etching product adhere, by means of ions in the plasma. The cleaning includes heating the substrate to a first temperature, introducing gas, which contains chlorine and nitrogen and in which a ratio of chlorine atoms to nitrogen atoms is 9:1 to 5:5, and applying high-frequency power to an electrode, on which the substrate is placed.
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patent: 2002/0037647 (2002-03-01), Hwang et al.
patent: 2003/0100151 (2003-05-01), Okamoto
patent: 2004/0115928 (2004-06-01), Malhotra et al.
patent: 2002-537645 (2002-11-01), None
Tomioka Kazuhiro
Zhuang Haoren
Infineon - Technologies AG
Kabushiki Kaisha Toshiba
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Vinh Lan
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