Method for manufacturing semiconductor device

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S624000, C438S763000

Reexamination Certificate

active

07052971

ABSTRACT:
A method for manufacturing a semiconductor device of the present invention includes, forming a first silicon oxide film by HDP-CVD so as to bury a recess portion in a three-dimensional portion formed in a surface region of a semiconductor workpiece to a position lower than an upper surface of the recess portion, and forming a second silicon oxide film by SOG on the first silicon oxide film so as to fill the recess portion.

REFERENCES:
patent: 6024106 (2000-02-01), Yang et al.
patent: 6335287 (2002-01-01), Hwang et al.
patent: 6335288 (2002-01-01), Kwan et al.
patent: 6380047 (2002-04-01), Bandyopadhyay et al.
patent: 6391781 (2002-05-01), Ozawa et al.
patent: 6395150 (2002-05-01), Van Cleemput et al.
patent: 6417073 (2002-07-01), Watanabe
patent: 6448150 (2002-09-01), Tsai et al.
patent: 6740601 (2004-05-01), Tan et al.
patent: 2002/0055271 (2002-05-01), Lee et al.
patent: 2003/0162363 (2003-08-01), Ji
patent: 2004/0126952 (2004-07-01), Gondhalekar et al.
patent: 2004/0198019 (2004-10-01), Yasui et al.
patent: 59-058837 (1984-04-01), None
patent: 59-225543 (1984-12-01), None
patent: 2000-114362 (2000-04-01), None
patent: 2000-183150 (2000-06-01), None
patent: 2000-294627 (2000-10-01), None
patent: 2000-332099 (2000-11-01), None
patent: 2001-135718 (2001-05-01), None
patent: 2001-244327 (2001-09-01), None
patent: 2003031650 (2003-01-01), None
Derwent Acc No. 2002-596241: Abstract of KR2002017588A.
Derwent Acc No. 2002-748804: Abstract of KR2002046828A.
Notification of Reason for Rejection issued by Japanese Patent Office, mailed Sep. 6, 2005, in Japanese Patent Application No. 2001-213689, and English-language translation.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for manufacturing semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for manufacturing semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for manufacturing semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3568818

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.