Method for manufacturing semiconductor apparatus

Semiconductor device manufacturing: process – Making regenerative-type switching device

Reexamination Certificate

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Details

C438S135000, C257SE21499, C257SE21513

Reexamination Certificate

active

07943439

ABSTRACT:
A manufacturing method is provided for manufacturing a semiconductor apparatus including a main semiconductor device and a subsidiary semiconductor device, which facilitates preventing characteristics variations from causing and reducing the manufacturing costs. The method includes forming p-type well region in the surface portion of single-crystal semiconductor substrate of a main semiconductor device, mounting a single-crystal silicon diode above p-type well region with an insulator film interposed between diode and p-type well region for forming subsidiary semiconductor device, forming an insulator film on the main semiconductor device such that single-crystal silicon diode is covered with insulator film for fixing single-crystal silicon diode to single-crystal semiconductor substrate, and forming a metal film on the main semiconductor device for further forming a cathode side wiring on n-type cathode region in single-crystal silicon diode and an anode side wiring on p-type anode region in single-crystal silicon diode.

REFERENCES:
patent: 4142115 (1979-02-01), Nakata et al.
patent: 5985708 (1999-11-01), Nakagawa et al.
patent: 6046470 (2000-04-01), Williams et al.
patent: 6055148 (2000-04-01), Grover
patent: 6313529 (2001-11-01), Yoshihara et al.
patent: 6818470 (2004-11-01), Acklin et al.
patent: 6872635 (2005-03-01), Hayashi et al.
patent: 2002/0025604 (2002-02-01), Tiwari
patent: 2002/0113247 (2002-08-01), Magri et al.
patent: 2003/0049915 (2003-03-01), Abe et al.
patent: 2003/0057482 (2003-03-01), Harada
patent: 2003/0119219 (2003-06-01), Farcy et al.
patent: 2004/0061176 (2004-04-01), Takafuji et al.
patent: 2004/0144992 (2004-07-01), Willmeroth et al.
patent: 2005/0045945 (2005-03-01), Yoshikawa et al.
patent: 2009/0140289 (2009-06-01), Torii
patent: 52-072183 (1977-06-01), None
patent: 05-021706 (1993-01-01), None
patent: 06-117942 (1994-04-01), None
patent: 07-297392 (1995-11-01), None
patent: 10-041510 (1998-02-01), None
patent: 10-256542 (1998-09-01), None
patent: 11-067820 (1999-03-01), None
patent: 2004-165600 (2004-06-01), None
patent: 2004-335719 (2004-11-01), None

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