Method for manufacturing gallium nitride compound...

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal

Reexamination Certificate

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C438S752000, C257S103000, C257S079000, C257S613000, C257S615000

Reexamination Certificate

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06861270

ABSTRACT:
A method for manufacturing a GaN compound semiconductor which can improve light emitting efficiency even when dislocations are present. An n type AlGaN layer, a undoped AlGaN layer, and a p type AlGaN layer are laminated on a substrate to obtain a double hetero structure. When the undoped AlGaN layer is formed, droplets of Ga or Al are formed on the n type AlGaN layer. The compositional ratio of Ga and Al in the undoped AlGaN layer varies due to the presence of the droplets, creating a spatial fluctuation in the band gap. Because of the spatial fluctuation in the band gap, the percentage of luminous recombinations of electrons and holes is increased.

REFERENCES:
patent: 3909929 (1975-10-01), Debesis
patent: 4985113 (1991-01-01), Fujimoto et al.
patent: 5332697 (1994-07-01), Smith et al.
patent: 5429954 (1995-07-01), Gerner
patent: 5633192 (1997-05-01), Moustakas et al.
patent: 5652438 (1997-07-01), Sassa et al.
patent: 5717226 (1998-02-01), Lee et al.
patent: 5767581 (1998-06-01), Nakamura et al.
patent: 5786233 (1998-07-01), Taskar et al.
patent: 5787104 (1998-07-01), Kamiyama et al.
patent: 5804918 (1998-09-01), Yazawa et al.
patent: 5874747 (1999-02-01), Redwing et al.
patent: 5880485 (1999-03-01), Marx et al.
patent: 5888886 (1999-03-01), Sverdlov et al.
patent: 5900650 (1999-05-01), Nitta
patent: 5929466 (1999-07-01), Ohba et al.
patent: 6030848 (2000-02-01), Yuge et al.
patent: 6046464 (2000-04-01), Schetzina
patent: 6090666 (2000-07-01), Ueda et al.
patent: 6103604 (2000-08-01), Bruno et al.
patent: 6172382 (2001-01-01), Nagahama et al.
patent: 6177684 (2001-01-01), Sugiyama
patent: 6191436 (2001-02-01), Shibata et al.
patent: 6242328 (2001-06-01), Shin
patent: 6261862 (2001-07-01), Hori et al.
patent: 6277665 (2001-08-01), Ma et al.
patent: 6355945 (2002-03-01), Kadota et al.
patent: 6423984 (2002-07-01), Kato et al.
patent: 6429102 (2002-08-01), Tsai et al.
patent: 6455337 (2002-09-01), Sverdlov
patent: 6465808 (2002-10-01), Lin
patent: 20020036286 (2002-03-01), Ho et al.
patent: 20020042159 (2002-04-01), Chiyo et al.
patent: 20020043890 (2002-04-01), Lu et al.
patent: 20030178634 (2003-09-01), Koide
patent: 20040026704 (2004-02-01), Nikolaev et al.
patent: 20040051105 (2004-03-01), Tsuda et al.
patent: 0 180 222 (1986-05-01), None
patent: 0 180 222 (1986-05-01), None
patent: 0 497 350 (1992-08-01), None
patent: 0 723 303 (1996-07-01), None
patent: 0 731 490 (1996-09-01), None
patent: 0 723 303 (1997-05-01), None
patent: 0 779 666 (1997-06-01), None
patent: 0 731 490 (1998-03-01), None
patent: 0 942 459 (1999-09-01), None
patent: 0 961 328 (1999-12-01), None
patent: 4-297023 (1992-10-01), None
patent: 4-288871 (1993-08-01), None
patent: 6-291366 (1994-10-01), None
patent: 407263408 (1995-10-01), None
patent: 9-17975 (1997-01-01), None
patent: 9-227298 (1997-09-01), None
patent: 10-22568 (1998-01-01), None
patent: 10-163525 (1998-06-01), None
patent: 10-312971 (1998-11-01), None
patent: 10-321913 (1998-12-01), None
patent: 11-111867 (1999-04-01), None
patent: 11-135832 (1999-05-01), None
patent: 11-145057 (1999-05-01), None
patent: 11-145516 (1999-05-01), None
patent: 11-266004 (1999-09-01), None
patent: 11-346032 (1999-12-01), None
patent: 11-346035 (1999-12-01), None
patent: 11-354839 (1999-12-01), None
patent: 11-354840 (1999-12-01), None
patent: 11-354842 (1999-12-01), None
patent: 2000-21789 (2000-01-01), None
patent: 2000-91252 (2000-03-01), None
patent: 2000-91253 (2000-03-01), None
patent: 2000-174344 (2000-06-01), None
patent: 2000-357820 (2000-12-01), None
patent: WO9842030 (1998-09-01), None
patent: WO9844569 (1998-10-01), None
English/Japanese Notice of Grounds For Rejection, Japanese Patent Application Ser. No. 2000-227963, 7 pages.
English/Japanese Notice of Grounds For Rejection, Japanese Patent Application Ser. No. 2000-164349, 4 pages.
Patent Abstract of Japanese Patent No. JP10312971, published Nov. 24, 1998, 1 page.
Patent Abstract of Japanese Patent No. JP2000021789, published Jan. 21, 2000, 1 page.
Patent Abstract of Japanese Patent No. JP11354839, published Dec. 24, 1999, 1 page.
Patent Abstract of Japanese Patent No. JP11354840, published Dec. 24, 1999, 1 page.
Patent Abstract of Japanese Patent No. JP11354842, published Dec. 24, 1999, 1 page.
Patent Abstract of Japanese Patent No. JP11266004 corresponding to U.S. Patent No. 6,177,684, published Jan. 23, 2001, 1 page.
Patent Abstracts of Japan, Publication No. 09227298A, published Sep. 2, 1977, 1 page.
Patent Abstracts of Japan, Publication No. 10022568A, published Jan. 23, 1998, 1 page.
Patent Abstracts of Japan, Publication No. 11135832A, published May 21, 1999, 1 page.
Patent Abstracts of Japan, Publication No. 11145057A, published May 28, 1999, 1 page.
Patent Abstracts of Japan, Publication No. 11145516A, published May 28, 1999, 1 page.
Patent Abstracts of Japan, Publication No. 11346032A, published Dec. 14, 1999, 1 page.
Patent Abstracts of Japan, Publication No. 11346035A, published Dec. 14, 1999, 1 page.
Patent Abstracts of Japan, Publication No. 2000091252A, published Mar. 31, 2000, 1 page.
Patent Abstracts of Japan, Publication No. 2000091253A, published Mar. 31, 2000, 1 page.
Patent Abstracts of Japan, Publication No. 2000357820A, published Dec. 26, 2000, 1 page.
Patent Abstracts of Jaanese Patent No. JP4297023 corresponding to European Patent No. EP0497350, published Aug. 5, 1992, 1 page.
“InGaN/GaN/AIGaN-based laser diodes with modulation-doped strained-layer superlattices grown on an epitaxially laterally overgrown GaN substrate”, Shuji Nakamura et al. Appl. Phys. Lett. 72 (2), Jan. 12, 1988, 1998 American Institute of Physics, 3 pages.
“Influence of sapphire nitridation on properties of gallium nitride grown by metalorganic chemical vapor deposition”, S. Keller et al. Appl. Phys. Lett. 68 (11), Mar. 11, 1996, 1996 American Institute of Physics, 3 pages.
“The effect of the Si/N treatment of a nitridated sapphire surface on the growth mode of GaN in low-pressure metalorganic vapor phase epitaxy”, S. Haffouz et al. Applied Physics Letters, vol. 73, No. 9, Aug. 31, 1998, 3 pages.
“Growth of high-quality GaN by low-pressure metal-organic vapour phase epitaxy (LP-MOVPE) from 3D islands and lateral overgroth”, H. Lahreche et al. N.H Elsevier Journal of Crystal Growth 205 (1999) 245-252, 8 pages.
“Optimization of Si/N Treatment Time of Sapphire Surface and Its Effect on the MOVPE GaN Overlayers”, S. Haffouz et al. phys. stat. sol. (a) 176, 677 (1999), 5 pages.
“Influence of in situ sapphire surface preparation and carrier gas on the growth mode of GaN in MOVPE” P. Venegues et al. N.H. Elsevier Journal of Crystal Growth 187 (1998) 167-177, 11 pages.
Excerpt from the Workbook of “The Tenth International Conference on Metalorganic Vapor Phase Epitaxy” Hokkaido University Jun. 5-9, 2000,5 pages.
Patent Abstracts of Japan, Publication No. 07097300, Publication Date Apr. 11, 1995, 1 page.
Patent Abstracts of Japan, Publication No. 10178213, Publication Date Jun. 30, 1998, 1 page.
Patent Abstracts of Japan, Publication No. 10242061, Publication Date Sep. 11, 1998, 1 page.
Patent Abstracts of Japan, Publication No. 11186174, Publication Date Jul. 9, 1999, 1 page.
Patent Abstracts of Japan, Publication No. 11274557, Publication Date Oct. 8, 1999, 1 page.
Patent Abstracts of Japan, Publication No. 2000306854, Publication Date Nov. 2, 2000, 1 page.
European Search Report dated Nov. 11, 2002, 4 pages.
European Search Report dated Nov. 27, 2002, 4 pages.
European Search Report dated Jan. 8, 2003, 3 pages.
Patent Abstracts of Japan, Publication No. 11111867, Publication Date Apr. 23, 1999, 1 page.
S. Sakai et al., “A New Method of Reducing Dislocation Density in GaN Layer Grown on Sapphire Substrate by MOVPE”, Journal of Crystal Growth 221 (2000) pp. 334-227.
European Search Report dated Nov. 27, 2002 (4pages).
Patent Abstracts of Japan, Publication No. 10242061, Publication Date Sep. 11, 1998, 1 page.
Patent Abstracts of Japan, Publication No. 11186174, Publication Date Jul. 9, 1999, 1 page.

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