Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-02-13
2009-08-25
Tang, Minh N (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S754090, C324S761010
Reexamination Certificate
active
07579855
ABSTRACT:
Disclosed is an electrical contact element used to test an electronic device. The electrical contact element has a beam portion and a tip portion attached to an end of the beam portion. In representative embodiments, a part of the beam portion is bent, e.g., such that the beam portion is zigzagged one or more times. A projection may be formed around a proximal end of the tip portion.
REFERENCES:
patent: 4916002 (1990-04-01), Carver
patent: 5116462 (1992-05-01), Bartha et al.
patent: 5177438 (1993-01-01), Littlebury et al.
patent: 5513430 (1996-05-01), Yanof et al.
patent: 6184053 (2001-02-01), Eldridge et al.
patent: 6307392 (2001-10-01), Soejima et al.
patent: 6482013 (2002-11-01), Eldridge et al.
patent: 6771084 (2004-08-01), Di Stefano
patent: 6811406 (2004-11-01), Grube
patent: 6970005 (2005-11-01), Rincon et al.
patent: 2002/0008530 (2002-01-01), Kim et al.
patent: 07-333232 (1995-12-01), None
patent: 08-050146 (1996-02-01), None
patent: 2002-071719 (2002-03-01), None
patent: 0151134 (1998-06-01), None
patent: 2001-0077628 (2001-08-01), None
patent: WO 97/43653 (1997-11-01), None
Jeong Seong Hoon
Lee Jung Hoon
Lee Oug-Ki
Lexyoume IP Group, LLC.
PHICOM Corporation
Tang Minh N
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