Semiconductor device manufacturing: process – Including control responsive to sensed condition
Reexamination Certificate
2007-05-22
2007-05-22
Picardat, Kevin M. (Department: 2822)
Semiconductor device manufacturing: process
Including control responsive to sensed condition
C438S010000, C438S012000
Reexamination Certificate
active
10941687
ABSTRACT:
It is an object of the present invention to provide a method of manufacturing a display device, which can display images favorably by insulating a short-circuit portion between an anode and a cathode. Further, it is another object of the invention to provide a method of manufacturing a display device, which can prevent intrusion of moisture so as to inhibit deterioration of a light emitting element when the short-circuit portion between the anode and the cathode is insulated. Specifically, the invention provide a method of manufacturing a display device, wherein a reverse bias voltage is applied to the light emitting element including an electro-luminescent material between the anode and the cathode so as to insulate the short-circuit portion between the anode and the cathode at a temperature of from −40° C. to 8° C., more preferably, from −25° C. to 8° C.
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Fujii Teruyuki
Hirakata Yoshiharu
Iwabuchi Tomoyuki
Tsuchiya Kaoru
Yamazaki Shunpei
Cook Alex McFarron Manzo Cummings & Mehler, Ltd.
Picardat Kevin M.
Semiconductor Energy Laboratory Co,. Ltd.
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