Semiconductor device manufacturing: process – With measuring or testing
Patent
1996-10-31
1998-02-10
Niebling, John
Semiconductor device manufacturing: process
With measuring or testing
438460, G01R 3126, H01L 21302
Patent
active
057168768
ABSTRACT:
In a method for manufacturing completely circular wafers, a specified crystal orientation of a cylindrical semiconductor crystal member is detected, and a blade is mounted on the semiconductor crystal member in accordance with the detected specified crystal orientation. Then, a recognition mark is marked on a top face of the semiconductor crystal member in accordance with a position of the blade. Then, the semiconductor crystal member and the blade are cut to form a semiconductor wafer and a blade piece. Finally, the semiconductor wafer is separated from the blade piece.
Booth Richard A.
NEC Corporation
Niebling John
LandOfFree
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