Method for manufacturing capacitor's lower electrode

Semiconductor device manufacturing: process – Making passive device – Stacked capacitor

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257309, H01L 2120, H01L 218242

Patent

active

060806338

ABSTRACT:
A method for forming the lower electrode of a capacitor comprising the steps of forming a first dielectric layer, a silicon nitride layer and an oxide layer over a substrate. Then, a first conducting layer is formed in an opening making electrical contact with a specified region of the substrate. Next, a first hemispherical grained silicon layer and a second dielectric layer are formed over the first conductive layer. Thereafter, the second dielectric layer, the first hemispherical grained silicon layer and the first conductive layer are patterned. Subsequently, a second conductive layer and a second hemispherical grained silicon layer are formed over the whole substrate structure. Next, portions of the second hemispherical grained silicon layer and the second conductive layer lying above the oxide layer and the second dielectric layer are removed. Finally, the second dielectric layer is removed to expose the first hemispherical grained silicon layer. This invention avoids the damaging effects to the first hemispherical grained silicon layer caused by the etching back operation, and prevents the formation of micro-bridges that may erroneously link up adjacent lower electrodes.

REFERENCES:
patent: 5278091 (1994-01-01), Fazan et al.
patent: 5622889 (1997-04-01), Yoo et al.
patent: 5792689 (1998-08-01), Yang et al.
patent: 5858837 (1999-01-01), Sakoh et al.
patent: 5933728 (1999-08-01), Sze
patent: 6004846 (1999-12-01), Iee

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for manufacturing capacitor's lower electrode does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for manufacturing capacitor's lower electrode, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for manufacturing capacitor's lower electrode will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1783956

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.