Method for manufacturing bipolar transistors having extremely re

Fishing – trapping – and vermin destroying

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437 24, 437 33, 148DIG10, 357 34, H01L 21266, H01L 2706, H01L 2710, H01L 21263

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050700286

ABSTRACT:
A method for manufacturing a heterobipolar transistor having and at least greatly diminished extrinsic base-collector capacitance provides an insulation implantation in a sub-collector layer grown onto a semi-insulating substrate via a first mask that covers a region provided for the sub-collector to be constructed or the sub-collector is formed by doping the semi-insulating substrate through a mask. The semiconductor layers for the collector, the base and the emitter, the sub-collector being fashioned in a limited region provided therefore and the emitter is aligned on the sub-collector with a second mask.

REFERENCES:
patent: 3687722 (1972-08-01), Saxena
patent: 4437225 (1984-03-01), Mizutani
patent: 4663831 (1987-05-01), Birrittella et al.
patent: 4682407 (1987-07-01), Wilson et al.
patent: 4728616 (1988-03-01), Ankin et al.
patent: 4839303 (1989-06-01), Tully et al.
Asbeck et al, "GaAs/(Ga,Al)As . . . Isolation Layers," IEEE Electron Device Letters, vol. EDL-5, No. 8, 1984, pp. 310-312.

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