Method for manufacturing and structure of semiconductor...

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Lateral bipolar transistor structure

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S378000, C257S434000, C257S556000, C257S560000, C257S563000, C257S564000

Reexamination Certificate

active

06870242

ABSTRACT:
A method including a buried layer formed on a semiconductor substrate, an active region formed adjacent to at least a portion of the buried layer, an isolation structure formed adjacent to at least a portion of the active region, and a gate oxide formed adjacent to at least a portion of the active region. The method also includes a polysilicon layer formed adjacent to at least a portion of the gate oxide having a portion removed to form a polysilicon definition structure that substantially surrounds and defines an emitter contact region. The method also includes forming a self-aligned implant region of the emitter contact region.

REFERENCES:
patent: 4669177 (1987-06-01), D'Arrigo et al.
patent: 5717241 (1998-02-01), Malhi et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for manufacturing and structure of semiconductor... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for manufacturing and structure of semiconductor..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for manufacturing and structure of semiconductor... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3400682

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.