Method for manufacturing an electrical interconnection by select

Coating processes – Electrical product produced – Condenser or capacitor

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1566591, 156662, 156664, 156665, 156666, 427 85, 427 90, 427 91, 427 96, 427 99, 430318, H01L 21285, H01L 2188

Patent

active

045172250

ABSTRACT:
A structure for an electrical interconnection suitable for a semiconductor integrated circuit is made by a process utilizing selective tungsten deposition at low pressure to form an intermediate conductive layer without significantly ablating nearby insulating material.

REFERENCES:
patent: 4267012 (1981-05-01), Pierce
patent: 4404235 (1983-09-01), Tarng
Shaw, "Vapor Deposited Tungsten for Silicon Devices", Solid State Technology, Dec. 1, 1971, pp. 53-57.
Miller, "Hot-Wall CVD Tungsten for VSLI", Solid State Technology, Dec. 1, 1980, pp. 79-82.

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