Method for manufacturing a substrate and a display device

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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C324S762010, C029S874000

Reexamination Certificate

active

06937041

ABSTRACT:
A probe for applying a voltage to lines provided on a substrate comprises (a) a conductive sheet, the conductive sheet including a mesh sheet in which linear members are woven into a mesh and a conductive material which coats the mesh sheet, (b) an elastic member for pressing the conductive sheet against the lines, and (c) a holding member for holding the conductive sheet and the elastic member together. The probe has improved electrical connectivity and durability, and achieves a reduction in size and facilitation of operations of an apparatus for manufacturing an electron source.

REFERENCES:
patent: 5543729 (1996-08-01), Henley
patent: 5622634 (1997-04-01), Noma et al.
patent: 6344711 (2002-02-01), Ohnishi et al.
patent: 6384541 (2002-05-01), Ohnishi et al.
patent: 60-259970 (1985-12-01), None
patent: 7-235255 (1995-09-01), None
patent: 07-262954 (1995-10-01), None
patent: 8-171849 (1996-07-01), None

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