Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of... – On insulating substrate or layer
Reexamination Certificate
2006-12-14
2008-11-18
Hoang, Quoc D (Department: 2892)
Semiconductor device manufacturing: process
Forming bipolar transistor by formation or alteration of...
On insulating substrate or layer
C438S404000, C257S347000, C257SE21320, C257SE27112
Reexamination Certificate
active
07452781
ABSTRACT:
A method for manufacturing a semiconductor substrate having a silicon-on-insulator (SOI) structure region isolated by a local oxidation of silicon (LOCOS) film and an SOI structure in the region includes forming the LOCOS film so as to make a height from an uppermost surface of a semiconductor member to a top surface of the LOCOS film be higher than a height from the uppermost surface of the semiconductor member to a top surface of the SOI structure, forming a silicon germanium layer and a silicon layer on the SOI structure region on the semiconductor member by epitaxial growth and forming a polysilicon film on a surface of the LOCOS film, forming a recess for a support to support the silicon layer to be a part of the SOI structure, forming the support on the semiconductor member, exposing a side of the silicon germanium layer and the silicon layer underneath the support, forming a cavity by removing the silicon germanium layer having the side exposed, forming the SOI structure by embedding an insulating layer to be buried in the cavity, planarizing a covering insulating film formed to cover an entire of a top surface of the semiconductor member by using the polysilicon film as a stopper, and exposing a top surface of the silicon layer in the SOI structure by etching.
REFERENCES:
patent: 7008701 (2006-03-01), Notsu et al.
patent: 2006-100681 (2006-04-01), None
patent: 2006-108206 (2006-04-01), None
patent: 2006-210683 (2006-08-01), None
T. Sakai et al., Separation by Bonding Si Islands (SBSI) for LSI Applications, Second International SiGe Technology and Device Meeting, Meeting Abstract, May 2004, pp. 230-231.
AdvantEdge Law Group, LLC
Hoang Quoc D
Seiko Epson Corporation
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