Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of... – Including isolation structure
Reexamination Certificate
2007-01-22
2010-11-30
Pham, Thanh V (Department: 2894)
Semiconductor device manufacturing: process
Forming bipolar transistor by formation or alteration of...
Including isolation structure
C438S430000, C257SE21197
Reexamination Certificate
active
07842579
ABSTRACT:
Various illustrative embodiments of methods for manufacturing a semiconductor device are described. These methods may include, for example, forming a first polysilicon layer above a substrate, wherein the first polysilicon layer comprises a doped portion, and forming a second polysilicon layer over a surface of the first polysilicon layer. Also, various illustrative embodiments of semiconductor devices are described that may be manufactured such as by the various methods described herein.
REFERENCES:
patent: 6750487 (2004-06-01), Fried et al.
patent: 6833588 (2004-12-01), Yu et al.
patent: 6930362 (2005-08-01), Mirabedini et al.
patent: 6995065 (2006-02-01), Chou et al.
patent: 7026688 (2006-04-01), Kim et al.
patent: 7045422 (2006-05-01), Enders et al.
patent: 7056814 (2006-06-01), Kim
patent: 2004/0209411 (2004-10-01), Fisher et al.
patent: 2007/0249077 (2007-10-01), Sze et al.
Lian Jingyu
Lipinski Matthias
Sarma Chandrasekhar
Zhuang Haoren
Banner & Witcoff , Ltd.
Infineon - Technologies AG
Pham Thanh V
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