Method for manufacturing a semiconductor device

Semiconductor device manufacturing: process – Having organic semiconductive component

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE29255

Reexamination Certificate

active

07820476

ABSTRACT:
A method for manufacturing a semiconductor device includes: forming a first region and a second region at a main surface of a semiconductor substrate; forming a gate insulating film containing Hf or Zr and oxygen on the first region and the second region; forming a first metallic film on the gate insulating film; forming a second metallic film on the first metallic film; removing a portion of the second metallic film; forming a third metallic film on the second metallic film and a portion of the first metallic film exposed by removing the portion of the second metallic film; and thermally treating so that constituent elements of the second metallic film is diffused into the gate insulating film via the first metallic film.

REFERENCES:
patent: 6376888 (2002-04-01), Tsunashima et al.
patent: 6784508 (2004-08-01), Tsunashima et al.
patent: 2002/0140036 (2002-10-01), Ma et al.
patent: 2003/0205767 (2003-11-01), Ma et al.
patent: 2005/0037580 (2005-02-01), Nakajima et al.
patent: 2002-329794 (2002-11-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for manufacturing a semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for manufacturing a semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for manufacturing a semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4228195

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.