Metal working – Method of mechanical manufacture – Electrical device making
Reexamination Certificate
2007-03-28
2009-06-23
Kim, Paul D (Department: 3729)
Metal working
Method of mechanical manufacture
Electrical device making
C029S603090, C029S603130, C029S605000, C029S606000, C324S210000, C324S212000, C360S031000, C360S121000, C360S317000, C427S127000, C427S128000
Reexamination Certificate
active
07549215
ABSTRACT:
A structure and method for performing magnetic inductance testing of write heads formed on a wafer. The structure and method allows for the effective inductive testing of magnetic write heads at wafer level even if the write heads have an inductance that is too low to be effectively measured directly. A test head is constructed having a structure similar to that of the write heads, but having a significantly higher magnetic inductance. The higher magnetic inductance of the write head can be provided by extending the shaping layer to or beyond the air bearing surface plane ABS. The inductance of the test head can be further increased by increasing the width of the portion of the shaping layer that extends to the ABS (ie. shaping layer throat) and by increasing the width of the write pole throat.
REFERENCES:
patent: 3753093 (1973-08-01), Gardner et al.
patent: 3931642 (1976-01-01), Kugimiya et al.
patent: 2008/0141522 (2008-06-01), Baer et al.
Hsiao Wen-Chien (David)
Yang Michael Ming Hsiang
Hitachi Global Storage Technologies - Netherlands B.V.
Kim Paul D
Zilka-Kotab, PC
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