Active solid-state devices (e.g. – transistors – solid-state diode – With specified impurity concentration gradient – With high resistivity
Reexamination Certificate
2005-09-27
2005-09-27
Zarabian, Amir (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
With specified impurity concentration gradient
With high resistivity
C257S523000, C438S379000, C438S223000
Reexamination Certificate
active
06949812
ABSTRACT:
A semiconductor structure for high frequency operation has a substrate with a doped well formed therein and a buffer layer made of a substrate material covers the well. The buffer layer is made of an undoped material and is disposed on a top side of the well for inhibiting an outdiffusion of a dopant from the well. At least a portion of the substrate is not covered by the buffer layer.
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Rohde, U. L.: “Microwave and Wireless Synthesizers”, John Wiley & Sons Inc., 1997, pp. 60-64.
Losehand Reinhard
Werthmann Hubert
Greenberg Laurence A.
Infineon - Technologies AG
Locher Ralph E.
Rose Kiesha
Stemer Werner H.
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