Method for manufacturing a free-standing substrate made of...

Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates – Subsequent separation into plural bodies

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S483000, C438S509000, C257SE21101

Reexamination Certificate

active

07407869

ABSTRACT:
A method for manufacturing a free-standing substrate made of a semiconductor material. A first assembly is provided and it includes a relatively thinner nucleation layer of a first material, a support of a second material, and a removable bonding interface defined between facing surfaces of the nucleation layer and support. A substrate of a relatively thicker layer of a third material is grown, by epitaph on the nucleation layer, to form a second assembly with the substrate attaining a sufficient thickness to be free-standing. The third material is preferably a monocrystalline material. Also, the removable character of the bonding interface is preserved with at least the substrate being heated to an epitaxial growth temperature. The coefficients of thermal expansion of the second and third materials are selected to be different from each other by a thermal expansion differential, determined as a function of the epitaxial growth temperature or subsequent application of external mechanical stresses, such that, as the second assembly cools from the epitaxial growth temperature, stresses are induced in the removable bonding interface to facilitate detachment of the nucleation layer from the substrate.

REFERENCES:
patent: 4983251 (1991-01-01), Haisma et al.
patent: 5374564 (1994-12-01), Bruel
patent: 5478513 (1995-12-01), Kosky et al.
patent: 5494835 (1996-02-01), Bruel
patent: 5919305 (1999-07-01), Solomon
patent: 6010579 (2000-01-01), Henley et al.
patent: 6100166 (2000-08-01), Sakaguchi et al.
patent: 6107213 (2000-08-01), Tayanaka et al.
patent: 6114188 (2000-09-01), Oliver et al.
patent: 6146457 (2000-11-01), Solomon
patent: 6146979 (2000-11-01), Henley et al.
patent: 6176925 (2001-01-01), Solomon et al.
patent: 6214701 (2001-04-01), Matsushita et al.
patent: 6218280 (2001-04-01), Kryliouk et al.
patent: 6245161 (2001-06-01), Henley et al.
patent: 6251754 (2001-06-01), Ohshima et al.
patent: 6274518 (2001-08-01), Yuri et al.
patent: 6291313 (2001-09-01), Henley et al.
patent: 6303405 (2001-10-01), Yoshida et al.
patent: 6326279 (2001-12-01), Kakizaki et al.
patent: 6335263 (2002-01-01), Cheung et al.
patent: 6420242 (2002-07-01), Cheung et al.
patent: 6498113 (2002-12-01), Solomon et al.
patent: 6521511 (2003-02-01), Inoue et al.
patent: 6653205 (2003-11-01), Yanagita et al.
patent: 6794276 (2004-09-01), Letertre et al.
patent: 6867067 (2005-03-01), Ghyselen et al.
patent: 6964914 (2005-11-01), Ghyselen et al.
patent: 2001/0006845 (2001-07-01), Kryliouk
patent: 2001/0022154 (2001-09-01), Cho et al.
patent: 2002/0019118 (2002-02-01), Chan
patent: 2002/0096674 (2002-07-01), Cho et al.
patent: 2002/0182889 (2002-12-01), Solomon et al.
patent: 2004/0029359 (2004-02-01), Letertre et al.
patent: 2004/0187766 (2004-09-01), Letertre et al.
patent: 0 546 752 (1993-06-01), None
patent: 0 528 229 (2000-06-01), None
patent: 1 045 431 (2000-10-01), None
patent: 2 787 919 (2000-06-01), None
patent: 2 817 394 (2002-05-01), None
patent: WO 99/01593 (1999-01-01), None
patent: WO 99/01899 (1999-01-01), None
patent: WO 99/471776 (1999-08-01), None
patent: WO 02/43112 (2002-05-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for manufacturing a free-standing substrate made of... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for manufacturing a free-standing substrate made of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for manufacturing a free-standing substrate made of... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4010446

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.