Fishing – trapping – and vermin destroying
Patent
1993-04-26
1994-03-29
Chaudhuri, Olik
Fishing, trapping, and vermin destroying
437203, 257213, H01L 21265
Patent
active
052984443
ABSTRACT:
A method for manufacturing a field effect transistor which includes one more spacer provided in the gate recess adjacent the drain sidewall than adjacent the source sidewall in the contact such that a gate metallization is displaced asymmetrically toward a source side sidewall of the recess; and method for manufacturing same wherein oblique vapor deposition of an auxiliary layer into a recess for the gate region makes it possible for a spacer therein at the source side to be removed whereas a spacer of the drain side remains in place, such that the subsequent gate metallization is positioned closer to the source than to the drain.
REFERENCES:
patent: 4196439 (1980-04-01), Niehaus et al.
patent: 4300148 (1981-11-01), Niehaus et al.
patent: 4910170 (1990-03-01), Motozima et al.
patent: 4956308 (1990-09-01), Griffin et al.
patent: 5024957 (1991-06-01), Harame et al.
patent: 5108939 (1992-04-01), Manky et al.
patent: 5155052 (1992-10-01), Davies
patent: 5208177 (1993-05-01), Lee
patent: 5240869 (1993-08-01), Nakatani
K. Steiner, et al., IEEE Transactions on Electron Devices, vol. 38, No. 8, Aug. 1991, "Minimum-Size Effects in Asymmetric Tilt-Angle-Implanted LLD-WN.sub.x -GaAs MESMFET's".
T. Enoki, et al., IEEE Transactions on Electron Devices, vol. 37, No. 4, Apr. 1990, "Characteristics Including Electron Velocity Overshoot for 0.1-.mu.m-Gate-Length GaAs SAINT MESFETs".
Booth Richard A.
Chaudhuri Olik
Siemens Aktiengesellschaft
LandOfFree
Method for manufacturing a field effect transistor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for manufacturing a field effect transistor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for manufacturing a field effect transistor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-791170