Method for managing semiconductor characteristic evaluation...

Details Method for managing semiconductor characteristic evaluation... Method for managing semiconductor characteristic evaluation...

2008-01-15

2008-01-15

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

History logging or time stamping

Reexamination Certificate

active

07319940

ABSTRACT:
A management method for data in a semiconductor characteristic evaluation apparatus comprised of a control unit, a memory unit, and input/output units includes steps for selecting the workspace including the test programs for testing a plurality of wafer types, for storing the test results in the selected workspace as histories, and for searching for the desired test results from the histories of the stored test results.

REFERENCES:
patent: 5206582 (1993-04-01), Ekstedt et al.
patent: 5768144 (1998-06-01), Nagase
patent: 6418391 (2002-07-01), Umezu et al.
patent: 6744266 (2004-06-01), Dor et al.
patent: 2002/0161532 (2002-10-01), Dor et al.
patent: 2003/0036875 (2003-02-01), Peck et al.
patent: 2005/0121612 (2005-06-01), Okuda et al.
patent: 1 156 431 (2001-11-01), None
patent: 2 352 058 (2001-01-01), None
patent: 08-122411 (1996-05-01), None
European Search Report for European Patent Application No. 06101154.0, Jun. 20, 2006.

Affiliated with

Also associated with

Rating

Method for managing semiconductor characteristic evaluation... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for managing semiconductor characteristic evaluation..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for managing semiconductor characteristic evaluation... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2747231