Coating processes – Optical element produced
Reexamination Certificate
2006-05-30
2006-05-30
Stein, Stephen (Department: 1775)
Coating processes
Optical element produced
C427S164000, C427S165000, C427S289000, C427S299000, C427S398100
Reexamination Certificate
active
07052733
ABSTRACT:
A method for making thin film filters having a negative temperature drift coefficient are the subject of the present invention. Such filters can achieve better optical control within an operational temperature range from −5° C. to 70° C. degrees. A first embodiment of the present invention includes: 1. providing a substrate wafer which has a coefficient of thermal expansion (CTE) greater than that of a selected film stack material; 2. polishing the substrate wafer; 3. depositing thin film layers made of the film stack material on the substrate wafer at a temperature substantially higher than room temperature; 4. cooling the substrate-film stack laminate to room temperature, thus forming a convex-shaped laminate; 5. cutting the cooled laminate into pieces. A second embodiment includes the steps of: 1. providing a laminate composed of a glass substrate and a film stack; 2. using at least one ion beam source to bombard the film stack of the laminate with high energy ions; 3. cutting the bombarded laminate into pieces.
REFERENCES:
patent: 4741962 (1988-05-01), Wada et al.
patent: 4793908 (1988-12-01), Scott et al.
patent: 6798553 (2004-09-01), Scobey et al.
patent: 2003/0123167 (2003-07-01), Kolberg et al.
Chen Ga Lane
Leu Charles
Chung Wei Te
Hon Hai - Precision Ind. Co., Ltd.
Stein Stephen
LandOfFree
Method for making thin film filter having a negative... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for making thin film filter having a negative..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for making thin film filter having a negative... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3594906