Method for making semi-insulating substrate by post-process heat

Metal treatment – Compositions – Heat treating

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29576B, 148187, 357 58, 357 91, H01L 21225, H01L 754

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active

044591594

ABSTRACT:
A method for making semiconductor integrated circuits which improves and decreases fringing capacitance in semiconductor integrated circuits. An oxygenated, single-crystal silicon lamella is lightly doped, producing an excess of holes, thereby forming a semiconductor substrate. The substrate is used to fabricate semiconductor devices in the usual way, except that density may be slightly increased. After fabrication, the substrate is heated, preferably at 450.degree. C., until resistivity of the substrate has increased so that non-diffused regions of the substrate are substantially non-conductive.

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Fuller and Logan, "Effect of Heat Treatment Upon the Electrical Properties of Silicon Crystals"; Journal of Applied Physics, vol. 28, No. 12, p. 1427, Dec., 1957.

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