Metal treatment – Compositions – Heat treating
Patent
1982-09-29
1984-07-10
Upendra, Roy
Metal treatment
Compositions
Heat treating
29576B, 148187, 357 58, 357 91, H01L 21225, H01L 754
Patent
active
044591594
ABSTRACT:
A method for making semiconductor integrated circuits which improves and decreases fringing capacitance in semiconductor integrated circuits. An oxygenated, single-crystal silicon lamella is lightly doped, producing an excess of holes, thereby forming a semiconductor substrate. The substrate is used to fabricate semiconductor devices in the usual way, except that density may be slightly increased. After fabrication, the substrate is heated, preferably at 450.degree. C., until resistivity of the substrate has increased so that non-diffused regions of the substrate are substantially non-conductive.
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Fuller and Logan, "Effect of Heat Treatment Upon the Electrical Properties of Silicon Crystals"; Journal of Applied Physics, vol. 28, No. 12, p. 1427, Dec., 1957.
Schneck Thomas
Upendra Roy
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