Method for making self-aligned ohmic contacts

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437 80, 437175, 437178, 437179, 437187, 437912, 437984, H01L 21265

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active

049853694

ABSTRACT:
A method of making a semiconductor device with self-aligned ohmic contacts which exhibits substantially reduced shadowing. The gate material is covered with a layer of gate mask material. The gate mask material is selectively removed to form a gate mask having sidewalls with slope profiles of an inclination sufficient to avoid maximum shadow encroachment for subsequent material depositions. Gate mask material is characterized by the sidewalls having an angularity relative to the surface of the substrate which is at least as great as the angle of evaporative deposition of ohmic contact material from a point evaporative source to the extreme gate position on the substrate.

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patent: 3761785 (1973-09-01), Pruniaux
patent: 3943622 (1976-03-01), Kim et al.
patent: 3951708 (1976-04-01), Dean
patent: 4048712 (1977-09-01), Buiatti
patent: 4525919 (1985-07-01), Fabian
patent: 4534826 (1985-08-01), Gath

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