Method for making enhanced substrate contact for a...

Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of... – Mesa or stacked emitter

Reexamination Certificate

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C438S307000

Reexamination Certificate

active

06987052

ABSTRACT:
A method of forming a semiconductor structure in a semiconductor wafer includes the steps of forming an epitaxial layer on at least a portion of a semiconductor substrate of a first conductivity type and forming at least one trench through the epitaxial layer to at least partially expose the substrate. The method further includes doping at least one or more sidewalls of the at least one trench with an impurity of a known concentration level. The at least one trench is then substantially filled with a filler material. In this manner, a low-resistance electrical path is formed between an upper surface of the epitaxial layer and the substrate.

REFERENCES:
patent: 5856700 (1999-01-01), Woodbury
patent: 6333234 (2001-12-01), Liu
patent: 6482714 (2002-11-01), Hieda et al.
patent: 6828628 (2004-12-01), Hergenrother et al.

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