Semiconductor device manufacturing: process – Gettering of substrate
Reexamination Certificate
2006-04-18
2006-04-18
Pham, Hoai (Department: 2814)
Semiconductor device manufacturing: process
Gettering of substrate
C438S480000
Reexamination Certificate
active
07029991
ABSTRACT:
The invention concerns a method comprising: 1) a first phase including steps which consist in forming in the upper part of a first initial semiconductor substrate a first layer of insulating material above a sectional plane of said first substrate, contacting the first layer of insulating material with the insulating upper part of a second initial substrate, so as to form a single layer of insulating material, a break at the sectional plane, so as to obtain an intermediate semiconductor substrate on the single insulating material layer; then, 2) in a second phase which consists in forming in the intermediate semiconductor substrate an additional insulating material layer adjacent to the single insulating material and topped with an upper layer of a final semiconductor substrate.
REFERENCES:
patent: 5589407 (1996-12-01), Meyyappan et al.
Jaouen Herve
Le Goascoz Vincent
Fleit Kain Gibbons Gutman Bongini & Bianco P.L.
Gibbons Jon A.
Jorgenson Lisa K.
Pham Hoai
STMicroelectronics S.A.
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