Method for making a SOI semiconductor substrate with thin...

Semiconductor device manufacturing: process – Gettering of substrate

Reexamination Certificate

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C438S480000

Reexamination Certificate

active

07029991

ABSTRACT:
The invention concerns a method comprising: 1) a first phase including steps which consist in forming in the upper part of a first initial semiconductor substrate a first layer of insulating material above a sectional plane of said first substrate, contacting the first layer of insulating material with the insulating upper part of a second initial substrate, so as to form a single layer of insulating material, a break at the sectional plane, so as to obtain an intermediate semiconductor substrate on the single insulating material layer; then, 2) in a second phase which consists in forming in the intermediate semiconductor substrate an additional insulating material layer adjacent to the single insulating material and topped with an upper layer of a final semiconductor substrate.

REFERENCES:
patent: 5589407 (1996-12-01), Meyyappan et al.

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