Method for making a sinusoidal test object

Details Method for making a sinusoidal test object Method for making a sinusoidal test object

1997-10-31

1999-07-27

Metjahic, Safet

Photography

Sensitometry

355 52, G03B 4100

Patent

active

059305460

ABSTRACT:
A method for forming a test object containing a sinusoidal pattern corresponding to a specified exposure distribution function comprises: providing an exposed and processed intermediate photographic film containing a distorted sinusoidal pattern image having harmonics necessary to produce a substantially undistorted sinusoidal pattern in an exposed and processed test object photographic film; exposing the test object film using the intermediate film containing the distorted sinusoidal pattern image; and processing the exposed test object film, thereby forming a test object containing a substantially undistorted sinusoidal test pattern.

REFERENCES:
patent: 3748019 (1973-07-01), Bestenreiner et al.
patent: 4653909 (1987-03-01), Kuperman
patent: 4915476 (1990-04-01), Hall et al.
patent: 4968117 (1990-11-01), Chern et al.
patent: 5429908 (1995-07-01), Hokuf et al.
patent: 5739898 (1998-04-01), Ozawa et al.

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