Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2006-08-15
2006-08-15
Nghiem, Michael (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
Reexamination Certificate
active
07092836
ABSTRACT:
A method for locating wiring swap in a hi-fix structure of a simultaneous multi-electronic device test system is introduced to screen the complicated wiring state of the hi-fix structure and to pinpoint the wiring swap thereinside as well. The hi-fix structure has at least S socket slots for testing electronic devices which each of the electronic devices has at least R leads. The present method, firstly, is to prepare R test unit sets which each of the test unit set includes S identical lead-off elements. Then, all R test unit sets are tested, in order, on the hi-fix structure and the respective test results are recorded. Finally, by analyzing the test results, the wiring swap inside the hi-fix structure can be accurately located.
REFERENCES:
patent: 5481203 (1996-01-01), Appold
patent: 5742168 (1998-04-01), Kiyokawa et al.
patent: 6198273 (2001-03-01), Onishi et al.
patent: 6204679 (2001-03-01), Gray, III
patent: 6304053 (2001-10-01), Johnson
patent: 6407566 (2002-06-01), Brunelle et al.
patent: 6483317 (2002-11-01), Floro et al.
patent: 6772380 (2002-11-01), Floro et al.
patent: 6774659 (2004-08-01), Chiang
patent: 2002/0144096 (2002-10-01), Burch
patent: 2003/0023802 (2003-01-01), Ho et al.
patent: 2003/0035400 (2003-02-01), Adler et al.
patent: 2003/0080726 (2003-05-01), Kroog et al.
patent: 2003/0179005 (2003-09-01), Buczkowski et al.
patent: 2004/0181718 (2004-09-01), Long
patent: 2004/0190331 (2004-09-01), Ross et al.
Lawicel Soft and Hardware uCAN.cpu.505, 2002, pp. 1-13.
candip.com, “What can I do with CANDIP/505 ?”, Sep. 13, 2000, pp. 1-2.
ST Microelectronics, M28010, 1 Mbit Parallel EEPROM With Software Data Protection,Jan. 1999, pp. 1-22.
ST Microelectronics, M28256, 256 Kbit Parallel EEPROM With Software Data Protection,Jan. 1999, pp. 1-22.
Lou Hsiao-Chi
Lu Ween-Chen
Mosel Vitelic Inc.
Nghiem Michael
Pretlow Demetrius
LandOfFree
Method for locating wiring swap in a hi-fix structure of a... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for locating wiring swap in a hi-fix structure of a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for locating wiring swap in a hi-fix structure of a... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3605377