Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Patent
1992-01-29
1992-11-10
Harvey, Jack B.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
For fault location
324512, 324537, 324158R, G01R 3108
Patent
active
051627426
ABSTRACT:
A method for locating electrical short circuits in an electronic substrate containing a plurality of conductive paths. A pair of shorted paths is identified and a current signal is applied thereto. Simultaneously, the voltage across the shorted paths is measured. The current signal is then increased in incremental steps until the voltage starts to vary nonlinearly with respect to the current signal. A temperature differential is then created between the substrate as a whole and small sectors of the substrate until the measured nonlinear relationship between current and voltage reverses in the direction of resuming a linear relationship. The small sector which caused the voltage to respond to the temperature differential is then identified, thereby identifying the approximate location of the short circuit.
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IBM Technical Disclosure vol. 15 No. 5 Oct. 1972 Uhls 324(512).
Atkins Nathan W.
Davies Philip J.
Suback Gary P.
Harvey Jack B.
Huberfeld Harold
International Business Machines - Corporation
Regan Maura K.
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