Method for linearizing the characteristic curve of an electronic

Measuring and testing – Gas analysis – Moisture content or vapor pressure

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G01N 724

Patent

active

041321162

ABSTRACT:
A method for linearizing the exponential characteristic curve of an electronic component, in particular the temperature/resistance characteristic of a thermistor is provided. The output value of the component is compared with the output value of a reference circuit varying exponentially in time and in the same sense as said characteristic, and the time interval is measured between a fixed starting moment, at which the exponential variation is already taking place, and the moment when the two output values become equal.

REFERENCES:
patent: 3477292 (1969-11-01), Thornton
patent: 3766782 (1973-10-01), Shimomura

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