Method for linearizing the characteristic curve of an electronic

Details Method for linearizing the characteristic curve of an electronic Method for linearizing the characteristic curve of an electronic

1977-10-21

1979-01-02

Swisher, S. Clement

Measuring and testing

Gas analysis

Moisture content or vapor pressure

G01N 724

Patent

active

041321162

ABSTRACT:
A method for linearizing the exponential characteristic curve of an electronic component, in particular the temperature/resistance characteristic of a thermistor is provided. The output value of the component is compared with the output value of a reference circuit varying exponentially in time and in the same sense as said characteristic, and the time interval is measured between a fixed starting moment, at which the exponential variation is already taking place, and the moment when the two output values become equal.

REFERENCES:
patent: 3477292 (1969-11-01), Thornton
patent: 3766782 (1973-10-01), Shimomura

Affiliated with

Also associated with

Rating

Method for linearizing the characteristic curve of an electronic does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for linearizing the characteristic curve of an electronic, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for linearizing the characteristic curve of an electronic will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1512144