Method for isolating semiconductor devices

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material

Reexamination Certificate

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C438S434000, C438S440000

Reexamination Certificate

active

11024632

ABSTRACT:
A method of isolating semiconductor devices including forming a pad layer on a semiconductor substrate, forming a trench by etching the semiconductor substrate to a predetermined depth using the pad layer as an etch barrier, implanting ion impurities into a bottom of the trench so as to increase an oxidation rate thereat, performing heat treatment for activating ion implanted impurities, growing a liner oxide film on a bottom and a sidewall of the trench, forming an isolation film on the liner oxide film so as to fill the trench, and smoothing the isolation film.

REFERENCES:
patent: 5498566 (1996-03-01), Lee
patent: 5885883 (1999-03-01), Park et al.
patent: 6133117 (2000-10-01), Tung
patent: 6248645 (2001-06-01), Matsuoka et al.
patent: 6355540 (2002-03-01), Wu
patent: 2004/0152324 (2004-08-01), Bentum et al.
patent: 2005/0118784 (2005-06-01), Kim

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