Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material
Reexamination Certificate
2007-03-13
2007-03-13
Lindsay, Jr., Walter L. (Department: 2812)
Semiconductor device manufacturing: process
Formation of electrically isolated lateral semiconductive...
Grooved and refilled with deposited dielectric material
C438S434000, C438S440000
Reexamination Certificate
active
11024632
ABSTRACT:
A method of isolating semiconductor devices including forming a pad layer on a semiconductor substrate, forming a trench by etching the semiconductor substrate to a predetermined depth using the pad layer as an etch barrier, implanting ion impurities into a bottom of the trench so as to increase an oxidation rate thereat, performing heat treatment for activating ion implanted impurities, growing a liner oxide film on a bottom and a sidewall of the trench, forming an isolation film on the liner oxide film so as to fill the trench, and smoothing the isolation film.
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Dongbu Electronics Co. Ltd.
Lindsay Jr. Walter L.
Mayer Brown Rowe & Maw LLP
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