Method for ion detection and mass spectrometry and apparatus the

Radiant energy – Ionic separation or analysis – Methods

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

250281, 250282, 250397, H01J 4302

Patent

active

054811082

ABSTRACT:
Object
To improve detecting sensitivity of negative ions.
Construction
A mass-filtered negative ion beam 22 is irradiated on a plate 24 after passing through a slit to emit neutral atoms 27, the neutral atoms 27 being ionized by an electron flow 33 after passing through a mesh electrode 30, the ion beam 35 ionized entering to a secondary electron multiplier to be amplified, then the amplified current entering to an amplifier 37 to be further amplified.
Effects
The detecting sensitivity can be improved more than ten times owing to the difference in existing amount of sputtering yield between neutral atoms and secondary ions.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for ion detection and mass spectrometry and apparatus the does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for ion detection and mass spectrometry and apparatus the, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for ion detection and mass spectrometry and apparatus the will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-237140

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.