Method for insulating film formation, storage medium from...

Coating apparatus – Gas or vapor deposition – Multizone chamber

Reexamination Certificate

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C438S761000, C438S762000

Reexamination Certificate

active

08034179

ABSTRACT:
In order to form an insulating film, which constitutes a flat interface with silicon, by CVD, a surface of silicon is oxidized to form a silicon oxide film using a plasma treatment apparatus in which microwaves are introduced into a chamber through a flat antenna having a plurality of holes. A silicon oxide film is formed as an insulating film on the silicon oxide film by CVD. Further, in the plasma treatment apparatus, a treating gas containing a noble gas and oxygen is introduced into the chamber, and, further, microwaves are introduced into the chamber through the flat antenna. Plasma is generated under a pressure in the range of not less than 6.7 Pa and not more than 533 Pa to modify the insulating film with the plasma.

REFERENCES:
patent: 2005/0136610 (2005-06-01), Kitagawa et al.
patent: 2006/0192248 (2006-08-01), Wang
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patent: 2006/025363 (2006-03-01), None
International Search Report for International Application No. PCT/JP2009/052447 mailed May 19, 2009 with English translation.

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