Method for inspection of surfaces

Details Method for inspection of surfaces Method for inspection of surfaces

1988-01-04

1990-11-20

Moore, David K.

Image analysis

Histogram processing

For setting a threshold

382 41, G06K 900

Patent

active

049724932

ABSTRACT:
An automatic system for the inspection of surfaces of an object employing computer vision. The system examines the uniformity of the surface and adds it to the negative of an ideal mask, and then thresholds the result to determine if the object is defective or not. A binary image showing only the defects is generated by the system. The system ignores surface features, such as locating notches or markings that are intentional, by "fitting" them with their morphological negatives. Small electronic packages, such as integrated circuit plastic packages (e.g. dual-in-line packages or DIPs), can be accurately inspected by the system. The system provides an objective, fast and economical method of inspecting objects.

REFERENCES:
patent: 4644585 (1987-02-01), Crimmins
patent: 4665551 (1987-05-01), Sternberg et al.
patent: 4672562 (1987-07-01), Egli et al.
patent: 4811410 (1989-03-01), Amir et al.

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