Optics: measuring and testing – Inspection of flaws or impurities – Containers or enclosures
Patent
1997-12-30
2000-04-11
Pham, Hoa Q.
Optics: measuring and testing
Inspection of flaws or impurities
Containers or enclosures
250223B, 348127, 382142, 65 2912, G01N 2100, C03B 900
Patent
active
060493798
ABSTRACT:
A method is disclosed for detecting flaws in translucent objects. An image generating device is used to form an image of the object. A target area and a control area of the image are then compared to determine the relative brightness of each. If the relative brightness is not within an acceptable range, then this indicates that a defect exists in the target area and the object may be rejected. The acceptable range may be determined by performing the above method on an object known to be non-defective, thus producing a relative brightness between the target and control areas which is indicative of a non-defective condition. Also disclosed is a method for detecting flaws in translucent objects in which two images of the object are obtained from differing perspectives. The two images are then compared pixel by pixel to determine if any variation in image brightness exists between the two images.
REFERENCES:
patent: 3387551 (1968-06-01), Hughes
patent: 3708679 (1973-01-01), Stock et al.
patent: 3767374 (1973-10-01), Iacovazzi et al.
patent: 3886356 (1975-05-01), Gomm et al.
patent: 4004904 (1977-01-01), Fergusson
patent: 4019819 (1977-04-01), Lodzinsi
patent: 4026656 (1977-05-01), Kusz et al.
patent: 4306835 (1981-12-01), Hurley
patent: 4332606 (1982-06-01), Gardner
patent: 4402721 (1983-09-01), Ericson et al.
patent: 4431436 (1984-02-01), Lulejian
patent: 4492476 (1985-01-01), Miyazawa
patent: 4494656 (1985-01-01), Shay et al.
patent: 4500203 (1985-02-01), Bieringer
patent: 4553217 (1985-11-01), Daudt et al.
patent: 4599099 (1986-07-01), Jones
patent: 4606746 (1986-08-01), Keller
patent: 4608072 (1986-08-01), Fenton
patent: 4614531 (1986-09-01), Bishop et al.
patent: 4639263 (1987-01-01), Kulikauskas
patent: 4649503 (1987-03-01), Keller
patent: 4664521 (1987-05-01), Scott et al.
patent: 4675042 (1987-06-01), Taddei-Contreras et al.
patent: 4679075 (1987-07-01), Williams et al.
patent: 4691830 (1987-09-01), Ahl et al.
patent: 4694158 (1987-09-01), Leser
patent: 4762544 (1988-08-01), Davey
patent: 4915237 (1990-04-01), Chang et al.
patent: 4948956 (1990-08-01), Fukuchi
patent: 4997769 (1991-03-01), Lundsgaard
patent: 5187368 (1993-02-01), Galante et al.
patent: 5305081 (1994-04-01), Gooch et al.
patent: 5345309 (1994-09-01), Wertz et al.
patent: 5437702 (1995-08-01), Burns et al.
patent: 5510610 (1996-04-01), Baldwin
patent: 5510621 (1996-04-01), Goldman
patent: 5717486 (1998-02-01), Burri et al.
patent: 5734467 (1998-03-01), Lucas
Abstract of WO98/07018 dated 02/19/1998 by Hidalgo et al. for "Method For Measurment of Light Transmittance".
"The Hand Book of Glass Manufacture" vol. II compiled & edited by Fay V. Tooley & published by Books for Industry, Inc., and the Glass Industry Magazine Division of Magazines for Industry, Inc., 1974, Library of Congress No. 74-77520, at pp. 961-975.
"Method for Inspecting Manufactured Articles", PhilipJ. Lucas, Inventor, Serial Number unknown, Filing Date unknown.
Coors Brewing Company
Goodwin, Esq. Michael A.
O'Meara, Esq. William P.
Pham Hoa Q.
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